Publikationen des Autors
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Blaschke, Daniel;
Munnik, Frans;
Grenzer, Jörg;
Rebohle, Lars;
Schmidt, Heidemarie;
Zahn, Peter;
Gemming, Sibylle
A correlation study of layer growth rate, thickness uniformity, stoichiometry, and hydrogen impurity level in HfO2 thin films grown by ALD between 100 °C and 350 °C
in: Applied Surface Science (2020) 144188-1
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Rayapati, Venkata Rao;
Bürger, Danilo;
Du, Nan;
Kowol, Cornelia;
Blaschke, Daniel;
Stöcker, Hartmut;
Matthes, Patrick;
Patra, Rajkumar;
Skorupa, Ilona;
Schulz, Stefan E.;
Schmidt, Heidemarie
Charged domains in ferroelectric, polycrystalline yttrium manganite thin films resolved with scanning electron microscopy
in: Nanotechnology (2020) 31LT01-1
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Kiani, Mahdi;
Du, Nan;
Vogel, Manja;
Raff, Johannes;
Hübner, Uwe;
Skorupa, Ilona;
Bürger, Danilo;
Schulz, Stefan E.;
Schmidt, Oliver G.;
Blaschke, Daniel;
Schmidt, Heidemarie
Disturbing-Free Determination of Yeast Concentration in DIWater and in Glucose Using Impedance Biochips
in: Biosensors (2020) 7-1
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Vegesna, Sahitya V.;
Bhat, Vinayak J.;
Bürger, Danilo;
Dellith, Jan;
Skorupa, Ilona;
Schmidt, Oliver G.;
Schmidt, Heidemarie
Increased static dielectric constant in ZnMnO and ZnCoO thin films with bound magnetic polarons
in: Scientific Reports (2020) 6698-1
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Pan, Xinqiang;
Shuai, Yao;
Wu, Chuangui;
Zhang, Lu;
Guo, Hongliang;
Cheng, Hong;
Peng, Yun;
Qiao, Shijun;
Luo, Wenbo;
Wang, Tao;
Sun, Xiangyu;
Zeng, Huizhong;
Zhang, Jianwei;
Zhang, Wanli;
Ou, Xin;
Du, Nan;
Schmidt, Heidemarie
Ar+ ions irradiation induced memristive behavior and neuromorphic computing in monolithic LiNbO3 thin films
in: Applied Surface Science (2019) 751
