Publikationen der Abteilung "Mikroskopie"

On the Properties of Nanoporous SiO2 Films for Single Layer Antireflection Coating

Ghazaryan, Lilit; Sekman, Yusuf; Schröder, Sven; Mühlig, Christian; Stevanovic, Igor; Botha, Roelene; Aghaee, Morteza; Creatore, Mariadriana; Tünnermann, Andreas; Szeghalmi, Adriana
in: Advanced Engineering Materials , (2019)
Successful optimization of reconstruction parameters in structured illumination microscopy – A practical guide

Karras, Christian; Smedth, Maria; Förster, Ronny; Deschout, Hendrik; Fernandez-Rodriguez, Julia; Heintzmann, Rainer
in: Optics Communications 436, 69 (2019)
cellSTORM - Cost-effective Super-Resolution on a Cellphone using dSTORM

Diederich, Benedict; Then, Patrick; Jügler, Alexander; Förster, Ronny; Heintzmann, Rainer
in: PLoS One 14, e209827-1 (2019)
Characterization of nonlinear optical crystal absorption

Mühlig, Christian; Bublitz, Simon
in: Optical Engineering 57, 121907-1 (2018)
Using machine-learning to optimize phase contrast in a low-cost cellphone microscope

Diederich, Benedict; Wartmann, Rolf; Schadwinkel, Harald; Heintzmann, Rainer
in: PLoS One 13, e0192937-1 (2018)
Automated distinction of shearing and distortion artefacts in structured illumination microscopy

Förster, Ronny; Müller, Walter; Richter, Renè; Heintzmann, Rainer
in: Optics Express 26, 20680 (2018)
Dual-SNOM investigations of multimode interference in plasmonic strip waveguides

Klein, Angela E.; Janunts, Norik; Schmidt, Sören; Bin Hasan, Shakeeb; Etrich, Christoph; Fasold, Stefan; Kaiser, Thomas; Rockstuhl, Carsten; Pertsch, Thomas
in: Nanoscale 9, 6695 (2017)
Quasi-linearly polarized hybrid modes in tapered and metal-coated tips with circular apertures: understanding the functionality of aperture tips

Tugchin, B.N.; Janunts, Norik; Steinert, Michael; Dietrich, Kay; Kley, Ernst-Bernhard; Tünnermann, Andreas; Pertsch, Thomas
in: New Journal of Physics 19, 063024-1 (2017)
Direct absorption measurements in thin rods and optical fibers

Mühlig, Christian; Bublitz, Simon; Lorenz, Martin
in: Optical Engineering 56, 011006-1 (2017)
Effect of Ion Beam Figuring and Subsequent AR Coating Deposition on the Surface Absorption of CaF2 at 193nm

Mühlig, Christian; Bublitz, Simon; Feldkamp, Roman; Bernitzki, Helmut
in: Applied Optics 56, C91 (2017)

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Publikationen der Abteilung "Mikroskopie"

On the Properties of Nanoporous SiO2 Films for Single Layer Antireflection Coating

Successful optimization of reconstruction parameters in structured illumination microscopy – A practical guide

cellSTORM - Cost-effective Super-Resolution on a Cellphone using dSTORM

Characterization of nonlinear optical crystal absorption

Using machine-learning to optimize phase contrast in a low-cost cellphone microscope

Automated distinction of shearing and distortion artefacts in structured illumination microscopy

Dual-SNOM investigations of multimode interference in plasmonic strip waveguides

Quasi-linearly polarized hybrid modes in tapered and metal-coated tips with circular apertures: understanding the functionality of aperture tips

Direct absorption measurements in thin rods and optical fibers

Effect of Ion Beam Figuring and Subsequent AR Coating Deposition on the Surface Absorption of CaF2 at 193nm