QsPV // QsPV-solar

In the energy transition scenarios, photovoltaics is a key element in meeting energy needs from renewable sources. The aim of the manufacturing industry must therefore be to develop and produce low-cost, efficient solar modules of consistently high quality, particularly with a view to establishing German products more firmly on the market. To this end, the joint R&D project focuses on a novel, compact, low-cost and in-line-capable measurement platform for quality management and research in photovoltaics based on a technologically innovative LED lighting technology. The external quantum efficiency is the basis for determining the spectral efficiency of a solar cell and an important indicator for identifying process errors in research and manufacturing. In particular, the current-voltage characteristics with and without illumination (“bright-dark” I-V characteristics) have been established for rapid characterization of a solar cell using a solar simulator for laboratory-based random quality control. Due to the increasing demand for photovoltaic systems, faster and better quality assurance methods are required in the photovoltaic industry. The proposed joint R&D project aims to develop a novel quality assurance method in the form of a measurement platform optimized for in-line testing, which for the first time will provide combined results from the two measurement methods mentioned above and can be used both in solar cell research and in in-line quality assurance in production. Such a method bridges the gap between solar cell research, development and industrial production. To evaluate the results, Leibniz IPHT is developing thin-film solar cells specifically on flexible textile substrates to address the agro-photovoltaic market and the textile industry as a whole. Leibniz IPHT is working with other partners in the field of smart textiles who have shown interest in the process to be developed. At the same time, the novel light source/measurement platform can also be used in chemical-physical-biological analysis technology. This can be done where fast spectral scanning is required or desired.

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