A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis

in: Review of Scientific Instruments (2019)
Wünsche, Martin; Fuchs, Silvio; Nathanael, Jan; Abel, Johann J.; Reinhard, Julius; Hübner, Uwe; Rödel, Christian
We present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12–41 nm (30–99 eV) with a high spectral resolution of _/__ & 784 _ 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography.

Third party cookies & scripts

This site uses cookies. For optimal performance, smooth social media and promotional use, it is recommended that you agree to third party cookies and scripts. This may involve sharing information about your use of the third-party social media, advertising and analytics website.
For more information, see privacy policy and imprint.
Which cookies & scripts and the associated processing of your personal data do you agree with?

You can change your preferences anytime by visiting privacy policy.