Diffusion in binary TiO2- SiO2 glasss
in: Optical Materials Express (2014)
The diffusion of titanium in TiO2-SiO2 glasses with up to 7 mol% TiO2 was investigated by annealing doped layers on the inner surface of quartz glass tubes between 1700 and 2000°C and measuring radial doping profiles via X-ray microprobe analysis and refractive index profiling subsequent to the tube collapse. By comparison with calculat-ed profiles, diffusion coefficients were able to be determined and fitted with an Arrhenius function. Both the preexponential D0 = 10(0.56+0.51c) cm2∙s-1 and the activation energy E = (473+11.6c) kJ∙mol-1 increase with increasing molar concentration of titanium c.